JVNDB-2023-000022
Vulnerability from jvndb - Published: 2023-03-08 06:09 - Updated:2024-06-03 08:36
Severity
Summary
Multiple vulnerabilities in SEIKO EPSON printers/network interface Web Config
Details
Web Config for printers/network interface provided by SEIKO EPSON CORPORATION contains multiple vulnerabilities listed below.
Stored cross-site Scripting (CWE-79) - CVE-2023-23572
Cross-Site Request Forgery (CWE-352) - CVE-2023-27520
Takaya Noma, Yudai Morii, Hiroki Yasui, Takayuki Sasaki, and Katsunari Yoshioka of Yokohama National University reported these vulnerabilities to IPA.
JPCERT/CC coordinated with the developer under Information Security Early Warning Partnership.
References
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Impacted products
| Vendor | Product | |
|---|---|---|
{
"@rdf:about": "https://jvndb.jvn.jp/en/contents/2023/JVNDB-2023-000022.html",
"dc:date": "2024-06-03T17:36+09:00",
"dcterms:issued": "2023-03-08T15:09+09:00",
"dcterms:modified": "2024-06-03T17:36+09:00",
"description": "Web Config for printers/network interface provided by SEIKO EPSON CORPORATION contains multiple vulnerabilities listed below.\r\n\u003cli\u003eStored cross-site Scripting (CWE-79) - CVE-2023-23572\r\n\u003cli\u003eCross-Site Request Forgery (CWE-352) - CVE-2023-27520\r\n\r\nTakaya Noma, Yudai Morii, Hiroki Yasui, Takayuki Sasaki, and Katsunari Yoshioka of Yokohama National University reported these vulnerabilities to IPA.\r\nJPCERT/CC coordinated with the developer under Information Security Early Warning Partnership.",
"link": "https://jvndb.jvn.jp/en/contents/2023/JVNDB-2023-000022.html",
"sec:cpe": {
"#text": "cpe:/a:epson:web_config",
"@product": "Web Config",
"@vendor": "SEIKO EPSON CORPORATION",
"@version": "2.2"
},
"sec:cvss": [
{
"@score": "3.5",
"@severity": "Low",
"@type": "Base",
"@vector": "AV:N/AC:M/Au:S/C:N/I:P/A:N",
"@version": "2.0"
},
{
"@score": "4.8",
"@severity": "Medium",
"@type": "Base",
"@vector": "CVSS:3.0/AV:N/AC:L/PR:H/UI:R/S:C/C:L/I:L/A:N",
"@version": "3.0"
}
],
"sec:identifier": "JVNDB-2023-000022",
"sec:references": [
{
"#text": "http://jvn.jp/en/jp/JVN82424996/index.html",
"@id": "JVN#82424996",
"@source": "JVN"
},
{
"#text": "https://www.cve.org/CVERecord?id=CVE-2023-27520",
"@id": "CVE-2023-27520",
"@source": "CVE"
},
{
"#text": "https://www.cve.org/CVERecord?id=CVE-2023-23572",
"@id": "CVE-2023-23572",
"@source": "CVE"
},
{
"#text": "https://nvd.nist.gov/vuln/detail/CVE-2023-23572",
"@id": "CVE-2023-23572",
"@source": "NVD"
},
{
"#text": "https://nvd.nist.gov/vuln/detail/CVE-2023-27520",
"@id": "CVE-2023-27520",
"@source": "NVD"
},
{
"#text": "https://www.ipa.go.jp/en/security/vulnerabilities/cwe.html",
"@id": "CWE-352",
"@title": "Cross-Site Request Forgery(CWE-352)"
},
{
"#text": "https://www.ipa.go.jp/en/security/vulnerabilities/cwe.html",
"@id": "CWE-79",
"@title": "Cross-site Scripting(CWE-79)"
}
],
"title": "Multiple vulnerabilities in SEIKO EPSON printers/network interface Web Config"
}
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Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
Browse all ATT&CK techniques and the vulnerabilities related to each.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
Browse all ATT&CK techniques and the vulnerabilities related to each.
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Related by attack behaviour
Vulnerabilities whose description is nearest to this one in the vector space of the CIRCL/vulnerability-attack-technique-biencoder model. This is a similarity search over the bi-encoder space (plain cosine), not a classification, and it has no measured accuracy.
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