FKIE_CVE-2019-20556
Vulnerability from fkie_nvd - Published: 2020-03-24 19:15 - Updated: 2026-06-17 02:30
Severity
Summary
An issue was discovered on Samsung mobile devices with P(9.0) (SM6150, SM8150, SM8150_FUSION, exynos7885, exynos9610, and exynos9820 chipsets) software. RKP memory corruption allows attackers to control the effective address in EL2. The Samsung ID is SVE-2019-15221 (October 2019).
References
Impacted products
| Vendor | Product | Version | |
|---|---|---|---|
| android | 9.0 | ||
| qualcomm | sm6150 | - | |
| qualcomm | sm8150 | - | |
| qualcomm | sm8150_fusion | - | |
| samsung | exynos_7885 | - | |
| samsung | exynos_9610 | - | |
| samsung | exynos_9820 | - |
{
"affected": [
{
"affectedData": [
{
"product": "n/a",
"vendor": "n/a",
"versions": [
{
"status": "affected",
"version": "n/a"
}
]
}
],
"source": "cve@mitre.org"
}
],
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"lang": "en",
"value": "An issue was discovered on Samsung mobile devices with P(9.0) (SM6150, SM8150, SM8150_FUSION, exynos7885, exynos9610, and exynos9820 chipsets) software. RKP memory corruption allows attackers to control the effective address in EL2. The Samsung ID is SVE-2019-15221 (October 2019)."
},
{
"lang": "es",
"value": "Se detect\u00f3 un problema en dispositivos m\u00f3viles Samsung con versi\u00f3n de software P(9.0) (SM6150, SM8150, SM8150_FUSION, exynos7885, exynos9610 y exynos9820). La corrupci\u00f3n de la memoria RKP permite a atacantes controlar la direcci\u00f3n efectiva en EL2. El ID de Samsung es SVE-2019-15221 (Octubre de 2019)."
}
],
"id": "CVE-2019-20556",
"lastModified": "2026-06-17T02:30:41.080",
"metrics": {
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"acInsufInfo": false,
"baseSeverity": "HIGH",
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"accessVector": "NETWORK",
"authentication": "NONE",
"availabilityImpact": "PARTIAL",
"baseScore": 7.5,
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"integrityImpact": "PARTIAL",
"vectorString": "AV:N/AC:L/Au:N/C:P/I:P/A:P",
"version": "2.0"
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"published": "2020-03-24T19:15:18.603",
"references": [
{
"source": "cve@mitre.org",
"tags": [
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"value": "CWE-787"
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"source": "nvd@nist.gov",
"type": "Primary"
}
]
}
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Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
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- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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