CVE-2023-43535 (GCVE-0-2023-43535)
Vulnerability from cvelistv5 – Published: 2024-02-06 05:47 – Updated: 2025-06-13 18:57
VLAI
EPSS
VEX
Title
Improper Validation of Array Index in Display
Summary
Memory corruption when negative display IDs are sent as input while processing DISPLAYESCAPE event trigger.
Severity
8.4 (High)
SSVC
Exploitation: none
Automatable: no
Technical Impact: partial
CISA Coordinator (v2.0.3)
CWE
- CWE-129 - Improper Validation of Array Index
Assigner
References
1 reference
Impacted products
1 product
| Vendor | Product | Version | |
|---|---|---|---|
| Qualcomm, Inc. | Snapdragon |
Affected:
FastConnect 6700
Affected: FastConnect 6900 Affected: FastConnect 7800 Affected: SC8380XP Affected: Snapdragon 7c+ Gen 3 Compute Affected: Snapdragon 8cx Gen 3 Compute Platform (SC8280XP-AB, BB) Affected: WCD9380 Affected: WCD9385 Affected: WSA8830 Affected: WSA8835 Affected: WSA8840 Affected: WSA8845 Affected: WSA8845H |
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Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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