CNVD-2016-11228
Vulnerability from cnvd - Published: 2016-11-17
VLAI
Title
Silicon Graphics LibTIFF缓冲区溢出漏洞
Description
Silicon Graphics LibTIFF是美国Silicon Graphics公司的一个读写TIFF(标签图像文件格式)文件的库。该库包含一些处理TIFF文件的命令行工具。
LibTIFF存在堆缓冲区溢出的安全漏洞,该漏洞源于应用程序在将用户数据复制至另一个大小不足的缓冲区之前未能正确检查边界条件。攻击者可利用漏洞在受影响的应用程序环境中执行任意代码,失败攻击可能将导致拒绝服务。
Severity
中
Patch Name
Silicon Graphics LibTIFF缓冲区溢出漏洞的补丁
Patch Description
Silicon Graphics LibTIFF是美国Silicon Graphics公司的一个读写TIFF(标签图像文件格式)文件的库。该库包含一些处理TIFF文件的命令行工具。
LibTIFF存在堆缓冲区溢出的安全漏洞,该漏洞源于应用程序在将用户数据复制至另一个大小不足的缓冲区之前未能正确检查边界条件。攻击者可利用漏洞在受影响的应用程序环境中执行任意代码,失败攻击可能将导致拒绝服务。目前,供应商发布了安全公告及相关补丁信息,修复了此漏洞。
Formal description
目前厂商已经发布了升级补丁以修复此安全问题,详情请关注厂商主页: http://www.libtiff.org/
Reference
http://www.securityfocus.com/bid/94271
Impacted products
| Name | Silicon Graphics, Inc. LibTiff 4.0.6 |
|---|
{
"bids": {
"bid": {
"bidNumber": "94271"
}
},
"cves": {
"cve": {
"cveNumber": "CVE-2016-9273"
}
},
"description": "Silicon Graphics LibTIFF\u662f\u7f8e\u56fdSilicon Graphics\u516c\u53f8\u7684\u4e00\u4e2a\u8bfb\u5199TIFF\uff08\u6807\u7b7e\u56fe\u50cf\u6587\u4ef6\u683c\u5f0f\uff09\u6587\u4ef6\u7684\u5e93\u3002\u8be5\u5e93\u5305\u542b\u4e00\u4e9b\u5904\u7406TIFF\u6587\u4ef6\u7684\u547d\u4ee4\u884c\u5de5\u5177\u3002\r\n\r\nLibTIFF\u5b58\u5728\u5806\u7f13\u51b2\u533a\u6ea2\u51fa\u7684\u5b89\u5168\u6f0f\u6d1e\uff0c\u8be5\u6f0f\u6d1e\u6e90\u4e8e\u5e94\u7528\u7a0b\u5e8f\u5728\u5c06\u7528\u6237\u6570\u636e\u590d\u5236\u81f3\u53e6\u4e00\u4e2a\u5927\u5c0f\u4e0d\u8db3\u7684\u7f13\u51b2\u533a\u4e4b\u524d\u672a\u80fd\u6b63\u786e\u68c0\u67e5\u8fb9\u754c\u6761\u4ef6\u3002\u653b\u51fb\u8005\u53ef\u5229\u7528\u6f0f\u6d1e\u5728\u53d7\u5f71\u54cd\u7684\u5e94\u7528\u7a0b\u5e8f\u73af\u5883\u4e2d\u6267\u884c\u4efb\u610f\u4ee3\u7801\uff0c\u5931\u8d25\u653b\u51fb\u53ef\u80fd\u5c06\u5bfc\u81f4\u62d2\u7edd\u670d\u52a1\u3002",
"discovererName": "geeknik",
"formalWay": "\u76ee\u524d\u5382\u5546\u5df2\u7ecf\u53d1\u5e03\u4e86\u5347\u7ea7\u8865\u4e01\u4ee5\u4fee\u590d\u6b64\u5b89\u5168\u95ee\u9898\uff0c\u8be6\u60c5\u8bf7\u5173\u6ce8\u5382\u5546\u4e3b\u9875\uff1a\r\nhttp://www.libtiff.org/",
"isEvent": "\u901a\u7528\u8f6f\u786c\u4ef6\u6f0f\u6d1e",
"number": "CNVD-2016-11228",
"openTime": "2016-11-17",
"patchDescription": "Silicon Graphics LibTIFF\u662f\u7f8e\u56fdSilicon Graphics\u516c\u53f8\u7684\u4e00\u4e2a\u8bfb\u5199TIFF\uff08\u6807\u7b7e\u56fe\u50cf\u6587\u4ef6\u683c\u5f0f\uff09\u6587\u4ef6\u7684\u5e93\u3002\u8be5\u5e93\u5305\u542b\u4e00\u4e9b\u5904\u7406TIFF\u6587\u4ef6\u7684\u547d\u4ee4\u884c\u5de5\u5177\u3002\r\n\r\nLibTIFF\u5b58\u5728\u5806\u7f13\u51b2\u533a\u6ea2\u51fa\u7684\u5b89\u5168\u6f0f\u6d1e\uff0c\u8be5\u6f0f\u6d1e\u6e90\u4e8e\u5e94\u7528\u7a0b\u5e8f\u5728\u5c06\u7528\u6237\u6570\u636e\u590d\u5236\u81f3\u53e6\u4e00\u4e2a\u5927\u5c0f\u4e0d\u8db3\u7684\u7f13\u51b2\u533a\u4e4b\u524d\u672a\u80fd\u6b63\u786e\u68c0\u67e5\u8fb9\u754c\u6761\u4ef6\u3002\u653b\u51fb\u8005\u53ef\u5229\u7528\u6f0f\u6d1e\u5728\u53d7\u5f71\u54cd\u7684\u5e94\u7528\u7a0b\u5e8f\u73af\u5883\u4e2d\u6267\u884c\u4efb\u610f\u4ee3\u7801\uff0c\u5931\u8d25\u653b\u51fb\u53ef\u80fd\u5c06\u5bfc\u81f4\u62d2\u7edd\u670d\u52a1\u3002\u76ee\u524d\uff0c\u4f9b\u5e94\u5546\u53d1\u5e03\u4e86\u5b89\u5168\u516c\u544a\u53ca\u76f8\u5173\u8865\u4e01\u4fe1\u606f\uff0c\u4fee\u590d\u4e86\u6b64\u6f0f\u6d1e\u3002",
"patchName": "Silicon Graphics LibTIFF\u7f13\u51b2\u533a\u6ea2\u51fa\u6f0f\u6d1e\u7684\u8865\u4e01",
"products": {
"product": "Silicon Graphics, Inc. LibTiff 4.0.6"
},
"referenceLink": "http://www.securityfocus.com/bid/94271",
"serverity": "\u4e2d",
"submitTime": "2016-11-14",
"title": "Silicon Graphics LibTIFF\u7f13\u51b2\u533a\u6ea2\u51fa\u6f0f\u6d1e"
}
Loading…
Loading…
Drag nodes to arrange them. Double-click a related vulnerability to open it, or a source to visit its link. The Physics button on the left tunes the layout and the simulation; the legend at the bottom left hides or shows nodes by kind and by sighting type.
Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
Vulnerability timeline
Sightings and recorded dates, grouped by day · UTC
Loading timeline…
Loading…
Loading…
The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
Browse all ATT&CK techniques and the vulnerabilities related to each.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
Browse all ATT&CK techniques and the vulnerabilities related to each.
Loading…
Related by attack behaviour
Vulnerabilities whose description is nearest to this one in the vector space of the CIRCL/vulnerability-attack-technique-biencoder model. This is a similarity search over the bi-encoder space (plain cosine), not a classification, and it has no measured accuracy.