CVE-2017-18279 (GCVE-0-2017-18279)
Vulnerability from cvelistv5 – Published: 2019-05-06 22:58 – Updated: 2024-08-05 21:13
VLAI
EPSS
VEX
Summary
Lack of check of buffer length before copying can lead to buffer overflow in camera module in Small Cell SoC, Snapdragon Mobile, Snapdragon Wear in FSM9055, FSM9955, IPQ4019, IPQ8064, MDM9206, MDM9607, MDM9640, MDM9650, MSM8909W, MSM8996AU, QCA9531, QCA9558, QCA9563, QCA9880, QCA9886, QCA9980, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 625, SD 650/52, SD 800, SD 810, SD 820, SD 835, SDM630, SDM636, SDM660, SDX20, Snapdragon_High_Med_2016.
Severity
7.8 (High)
CWE
- CWE680: Integer Overflow to Buffer Overflow
Assigner
References
1 reference
| URL | Tags |
|---|---|
| https://www.qualcomm.com/company/product-security… | x_refsource_MISC |
Impacted products
1 product
| Vendor | Product | Version | CPE status | |
|---|---|---|---|---|
| Qualcomm Technologies, Inc. | Small Cell SoC, Snapdragon Mobile, Snapdragon Wear |
Affected:
FSM9055
Affected: FSM9955 Affected: IPQ4019 Affected: IPQ8064 Affected: MDM9206 Affected: MDM9607 Affected: MDM9640 Affected: MDM9650 Affected: MSM8909W Affected: MSM8996AU Affected: QCA9531 Affected: QCA9558 Affected: QCA9563 Affected: QCA9880 Affected: QCA9886 Affected: QCA9980 Affected: SD 210/SD 212/SD 205 Affected: SD 425 Affected: SD 427 Affected: SD 430 Affected: SD 435 Affected: SD 450 Affected: SD 615/16/SD 415 Affected: SD 625 Affected: SD 650/52 Affected: SD 800 Affected: SD 810 Affected: SD 820 Affected: SD 835 Affected: SDM630 Affected: SDM636 Affected: SDM660 Affected: SDX20 Affected: Snapdragon_High_Med_2016 |
guessed |
Date Public
2019-03-25 00:00
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Advisory\"]},{\"url\":\"https://www.qualcomm.com/company/product-security/bulletins\",\"source\":\"af854a3a-2127-422b-91ae-364da2661108\",\"tags\":[\"Vendor Advisory\"]}]}}"
}
}
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Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
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