tid-105
Vulnerability from emb3d
A threat actor with physical access to a device may be able to manipulate the processor’s intended code execution by subjecting it to hardware faults or “glitching”. Hardware faults can be induced by various methods, including voltage fault injection (power glitching), electromagnetic pulses (EM glitching), and optical fault injection. Glitching can be used to bypass various security protections on a device, such as skipping a firmware integrity check during a secure boot process or protections against firmware or data read-out from the device. This threat requires physical access to the device to perform the glitching, and also typically requires substantial iterative testing to identify the precise nature, magnitude, and timing of signals that need to be injected to cause the glitch condition.
- CWE-1247: Improper Protection Against Voltage and Clock Glitches (Base)
- CWE-1319: Improper Protection against Electromagnetic Fault Injection (EM-FI) (Base)
Sightings
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Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.